Products

  • D8 Discover
  • 產品廠牌: Bruker
    產品簡述: X-ray Diffractometer can measured the thickness, lattice constant, density, structure and composition analyzer

    Nation of Principal:Germany
    Product Application
    Compound semiconductor thin film measurement, including  layer thickness, lattice constant, element concentration, density of LED epi-layer
    Related Link
    http://www.bruker.com/

製程說明
1.  Non-destructive measurement
2.  Modulize design and easy to upgrade
3.  layer thickness, lattice constant, element concentration, density
4.  Multi-wafer : 2”*12 & 4”*4
5.  Unique horizontal measurement with high accuracy monochrometer, time saving and reducing the risk for sample falling
6.  Two measurement modes in one detector only, high intensity and high resolution
7.  multi-software method to calculate(fit) data