• D8 Fabline / XRD & u-XRF
  • 產品廠牌: Bruker
    產品簡述: X-ray Diffractometer can measured the thickness, lattice constant, density, structure and composition analyzer

    Nation of Principal:Germany
    Product Application
    semiconductor thin film or 
                                        bump, fully automation for 

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1. Non-destructive measurement
2. Modulize design and easy to upgrade.
3. Bump thickness, lattice constant, element concentration, density
4. Two measurement modes in one detector only, high intensity and high resolution
5. Multi-software method to calculate(fit) data
6. EDX solution
7. Measure bump size below 20um