MDPinline


  • BRAND: Freiberg Instrument
  • DESCRIPTION: Measured the lifetime, resistanceand thickness of Si wafer, epi-layer, partially or fully processed wafer and compound semiconductor
  • Nation of Principal:Germany
    Product Application
    1. lifetime (mapping)

                                        2. Resistivity (linescan)

                                        3. thickness (linescan)

                                        4. Material: silicon wafer, epi
                                            layer, partially or fully
                                            processed wafer, compound
                                            semiconductor

    Related Linkhttp://www.freiberginstruments.de/
    Keyword:Solar,Photovoltaics,life-time

1. Inline mapping one wafer less than one second.
2. wafer classification based on lifetime data.
3. lifetime measurement at steady state (u-PCD also able)

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