Products

  • SE400 PV
  • 產品廠牌: Sentech
    產品簡述: Measured the thickness, n index, k index of the different kinds of thin film with roughness surface
    Nation of Principal:Germany
    Product Application
    Ellipsometer and Reflectometer can measure thickness, refractive index and extinction coefficient of any kind of thin film with roughness surface
    Related Linkhttp://www.sentech.de/
    Keyword:
    Solar,Photovoltaics,metrology

製程說明
1. Ellipsometer and Reflectometer are non-destructive measuring instrument.
2. It can measure the thickness, n index of optical thin film with roughness surface
3. Provided high accuracy, stability and repeatibility measurement result.