RM 1000 / 2000

  • BRAND: Sentech
  • DESCRIPTION: Spectroscopic reflectometers
  • Nation of Principal:Germany
    Product Application
    The spectroscopic reflectometers RM 1000 and RM 2000 measure reflectance of flat or curved samples with smooth or rough surface. Thickness, extinction coefficient, and refractive index of single films or layer stacks are calculated using SENTECH FTPadv Expert software. Single films between 5 nm and 50 µm thickness, layer stacks, and substrates can be analyzed in the UV‑VIS‑NIR spectral range.
    Related Linkhttp://www.sentech.de/

Reflectometer capable of UV-VIS-NIR spectral range of monolayer film, multilayer film and substrate materials for high-precision measurement of reflectance spectra. It can be transparent or absorbing or transparent substrate analysis of weakly absorbing film thickness and refractive index


  • MDPmap 1. Offline mapping less than 5 minute. 2. wafer classification based on lifetime data 3. lifetime..