SE400


  • BRAND: Sentech
  • DESCRIPTION: Measured the thickness, n index, k index of the different kinds of thin film
  • Nation of Principal:Germany
    Product Application
    Ellipsometer and Reflectometer can measure thickness, refractive index and extinction coefficient of any kind of thin film
    Related Linkhttp://www.sentech.de/
    Bonder:ellipsometer



1. Ellipsometer and Reflectometer are non-   destructive measuring instrument.
2. Ellipsometer and Reflectometer can measure thickness, refractive index and extinction coefficient of any kind of optical thin film.
3. Provided high accuracy, stability and repeatibility measurement result.

RelatedProduct

  • MDPmap 1. Offline mapping less than 5 minute. 2. wafer classification based on lifetime data 3. lifetime..