• PIDcon
  • 產品廠牌: Freiberg Instrument
    產品簡述: fast ingot mapping system for high throughput multicrystalline silicon fabs

    Nation of Principal:Germany
    Product Application
    Potential Induced Degradation control of solar cells and encapsulation films as commercially available bench top metrology solution, is introduced by Freiberg Instruments. The system builds on the knowledge of Fraunhofer CSP in Halle Germany (patent pending).
    Related Link

PID test for Solar cell