SE800


  • BRAND: Sentech
  • DESCRIPTION: Measured the thickness, n index, k index of the different kinds of thin film
  • Nation of PrincipalGermany
    Product Application
    Ellipsometer and Reflectometer can measure thickness, refractive index and extinction coefficient of any kind of thin film
    Related Link
    http://www.sentech.de/

1. Spectral-scopic ellipsometer
2. Fast and very sensitive ellipsometric analysis
3. Stabilized compensator for depolarization correction 
4. Step Scan Analyzer and polarizer tracking for accurate sample analysis 

RelatedProduct

  • MDPmap 1. Offline mapping less than 5 minute. 2. wafer classification based on lifetime data 3. lifetime..