1. Resolution reach to 0.5mm
2. Ingot mesurement length is 500mm Max.
3. Auto mark cutting line refer to Ingot measured characters
4. Lifetime measurement is under steady state
5. FB concentration measurement is able (option)
MDPmap 1. Offline mapping less than 5 minute.
2. wafer classification based on lifetime data
MDPlinescan1.Flexible OEM unit for lifetime measurements
2.Standard software interface for easy connection to..
SE400 PV1. Ellipsometer and Reflectometer are non-destructive measuring instrument.
2. It can measure the t..
SE800 PV1. Spectral-scopic ellipsometer
2. Measure double AR layer thickness, refractive index on textured ..