• BRAND: Freiberg Instrument
  • DESCRIPTION: fast ingot mapping system for high throughput multicrystalline silicon fabs
  • Nation of Principal:Germany
    Product Application
    Potential Induced Degradation control of solar cells and encapsulation films as commercially available bench top metrology solution, is introduced by Freiberg Instruments. The system builds on the knowledge of Fraunhofer CSP in Halle Germany (patent pending).
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