DESCRIPTION： QC for PERC back side manufacturing, measured the thickness, n index.
Nation of Principal：Germany
Product Application：Application for different kinds of thin film, R&D / Photovoltaics Related Link：http://www.sentech.de/ Keyword：spectroscopic ellipsometer
-QC for PERC back side manufacturing
-Thickness and refractive index measurement of Al2O3 and SiNx films on PERC back side
-Long term stability monitoring of Al2O3 and SiNx deposition
