SENresearch 4.0 The SENresearch 4.0 is the new SENTECH spectroscopic ellipsometer. Every individual SENresearch 4.0 ..
SI ALD LL SENTECH atomic layer deposition systems enable thermal and plasma enhanced operation, which can be c..
SI 500 D It provides excellent performance for silane based deposition processes in Si and III-V semiconducto..
Etchlab 200 Etchlab 200 can accommodate a wide variety of etch processes, e.g. Si, SiO2, metals, III-V compoun..
RM 1000 / 2000 Reflectometer capable of UV-VIS-NIR spectral range of monolayer film, multilayer film and substrate ..
SE400 1. Ellipsometer and Reflectometer are non- destructive measuring instrument. 2. Ellipsometer and Re..
SE800 1. Spectral-scopic ellipsometer 2. Fast and very sensitive ellipsometric analysis 3. Stabilized c..
SI 500 1.Low damage for nano structuring 2.Simple high rate etching 3.Inhouse ICP plasma source 4.Dynami..