チャレンテック株式会社

NEWS & Events

19 Feb	SEMICON® CHINA 2019	2019
	Challentech represent the products in the applications of Se..

23 Nov	Rudolph WS3880	2018
	Rudolph WS3880 Tool ID#: 122 Manufacturer: Rudolph M..

23 Nov	Ultratech Stepper AP200	2018
	Ultratech Stepper AP200 Tool ID#: 121 Manufacturer: Ultr..

- COAXIAL
- COSMOTEC
- Coaxial series are used for transmission purposes. Volta..
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- SENresearch 4.0
- Sentech
- Measured the thickness, n index, k index of the differen..
- The SENresearch 4.0 is the new SENTECH spectroscopic ellipsometer. Every individual SENres..
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- THERMOCOUPLE
- COSMOTEC
- Thermocouple series are used for temperature measurement..
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- Transportation/Robot
- JEL
- Japan
- l Be applied for Semiconductor, LED, FPD & Touch Panel process system. l Be integrate..
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- Etu Manager
- Etu
- Big data by Hadoop
- Etu Manager has high functionalities, adjustable to special features of software and har..
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- HIGH VOLTAGE AND HIGH CURRENT
- COSMOTEC
- Power High Voltage and High Current series are used for ..
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- LID Scope
- LayTec
- Monitoring of Light Induced Degradation (LID)
- 1. Test already on cell level 2. For all LID prone cell types 3. At the line or in the l..
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- RM 1000 / 2000
- Sentech
- Spectroscopic reflectometers
- Reflectometer capable of UV-VIS-NIR spectral range of monolayer film, multilayer film and ..
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- dFFOZ.
- Teledyne
- - In-situ monitoring - No consumables - Ranges up to 150 mg/L - High accuracy UV Absorp..
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- SCR3160CSN
- JEL
- 大気用クリーン搬送ロボット
- 1.スーパークリーンルーム用3軸円筒座標型クリーンロボットです 2.低価格、高速搬送、脱調レス..
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- EpiEL-100
- MaxMile
- 1.reduce In-dot process and wafer-level LED optical and electrical properties measurement...
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- FSBL-50
- Technomate CO., LTD
- High Pressure Pump Dimension: FSBL W250*H191*D413 mm
- 1.IPA and solvent stripping on high pressure cleaning wafer 2.Air pressure pump can be us..
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- SE400 PV
- Sentech
- Measured the thickness, n index, k index of the differen..
- 1. Ellipsometer and Reflectometer are non-destructive measuring instrument. 2. It can mea..
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- SINUS-220
- Wavelabs
- 1. 21-COLOR LED-BASED LIGHT SOURCE 2. STATE-OF-THE-ART LENS SYSTEMS 3. BUILT-IN SPECTROM..
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- OG-5000
- Teledyne
- High concentration Ozone generator
- - High Purity Ozone - Very High Ozone concentrations - Environmentally friendlier than o..
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- ACCESSORIES
- COSMOTEC
- Accessories series are available that connect feedthroug..
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- CERAMIC BREAKS, ISOLATORS AND ENVELOPES
- COSMOTEC
- Isolator series are used for insulation up to 24 kV.
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- OptiPrime-CD
- n&k
- Measuring the thicknesses, n index and k index, CD, dept..
- 1. The spectral range of this system is 190-1000nm 2. The measurement Spot Size is 50um ..
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- VOS-2900/3900
- Challentech
- Virtual Operation System
- 1. Centralized control and real time management. 2. Industrial safety and information sec..
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- Metal Organic Source
- Nata
- China
- Production Flow The manufacturing of MO precursors is mainly falls four parts: synthesis, ..
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- INSTRUMENTATION MULTI-PIN
- COSMOTEC
- Multi-Pin series are used for instrumentation measuremen..
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- SE800
- Sentech
- Measured the thickness, n index, k index of the differen..
- 1. Spectral-scopic ellipsometer 2. Fast and very sensitive ellipsometric analysis 3. St..
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- SCI-Mux.
- Teledyne
- Control Ozone generator when Orzone analyzer detect the ..
- - Interconnects up to 4 ozone sensors - Servo loop for up to 4 ozone generators - Microp..
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- SSBL-30
- Technomate CO., LTD
- High Pressure Pump Dimension: SSBL W123*H116*D296.5 mm
- 1.IPA and solvent stripping on high pressure cleaning wafer 2.Air pressure pump can be us..
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- SENperc PV
- Sentech
- QC for PERC back side manufacturing, measured the thickn..
- -QC for PERC back side manufacturing -Thickness and refractive index measurement of Al2O3..
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- SE800 PV
- Sentech
- Measured the thickness, n index, k index of the differen..
- 1. Spectral-scopic ellipsometer 2. Measure double AR layer thickness, refractive index on..
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- SSBL-37.5
- Technomate CO., LTD
- High Pressure Pump Dimension: SSBL W123*H116*D296.5 mm
- 1.IPA and solvent stripping on high pressure cleaning wafer 2.Air pressure pump can be us..
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- SE400
- Sentech
- Measured the thickness, n index, k index of the differen..
- 1. Ellipsometer and Reflectometer are non- destructive measuring instrument. 2. Ellipsome..
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- SI 500 PPD
- Sentech
- Inductively coupled plasma etching system
- 1.PECVD with highly process flexibility on temperature & film 2.Vacuum loadlock with..
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- OptiPrime
- n&k
- Measuring the thicknesses, n index and k index, CD, dept..
- 1. The spectral range of this system is 190-1000nm 2. The measurement Spot Size is 50um ..
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- 5700-CDRT
- n&k
- Measuring the thicknesses, n index and k index, CD, dept..
- 1. The spectral range of this system is 190-1000nm 2. The reflectence measurement Spot Si..
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- JEL Robot Service
- JEL
- JEL Robot Overhaul
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- MO 8.0/MO 10.0
- Lauda-Noah
- Provided the constant temperature control for Metal orga..
- 1. Unique technology for thermostat of MO source 2. Sealed lid, no consuming manpower to ..
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- 3700-RT
- n&k
- Measuring the thicknesses, n index and k index, CD, dept..
- 1. The spectral range of this system is 190-1000nm 2. The reflectence measurement Spot Si..
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- OPTI-Sense 5000.
- Teledyne
- End point detection for chamber clean Process
- - Compact size - No moving parts - In-situ measurement - Analog and digital outputs - ..
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- Clean Control Tech
- CCT
- Clean room products
- 1.Clean room products provider 2.Micron highest level 3. ISO 3~6(Class 1--1000) certificat..
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- SIPAR
- Sentech
- 1. Lower price, higher throughput and smaller footprint 2. Hybrid multilayers composed of..
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- Romulus.
- Quad Group Inc.
- Analyze the adhesion strength of the thin film coating o..
- 1.The ROMULUS UNIVERSAL TESTER is a computer operated test Instrument for evaluating: all ..
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- CAT-O3-E
- Teledyne
- Ozone destructor can destruct the Ozone to O2 and exhaus..
- - Catalyst-based ozone destruction - Rapid reaction time - Environmentally-safe byproduc..
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- SI 500
- Sentech
- Inductively coupled plasma etching system
- 1.Low damage for nano structuring 2.Simple high rate etching 3.Inhouse ICP plasma source..
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- MWB-04/06/08AX
- MHI
- Japan
- 1.Wafers are irradiated with atoms or ions in a vacuum. 2.Oxide film and absorption layer..
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- Laser micromachining system ABLASER
- MHI
- The ABLASER was first launched in FY2014; the first prod..
- The ABLASER adopts an ultra-short pulse laser that enables machined surfaces of micro prec..
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- C-SAM
- PVA TePla Analytical Sys..
- Measured the defect of chip or wafer
- 1. Ongoing requirements for non-destructive methods in F/A - 2. Measurement of failure -..
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- SenSol H
- Sentech
- Provided a measured system can mount different measured ..
- Do whole glass mapping. Glass size: up to 2.2m*2.5m It can mount differen sensors to mon..
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- 8000-CD
- n&k
- Measuring the thicknesses, n index and k index, CD, dept..
- 1. The spectral range of this system is 190-1000nm 2. The measurement Spot Size is 50um ..
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- Gemini
- n&k
- Automated measuring the thicknesses, n index and k index..
- 1. The spectral range of this system is 190-1000nm 2. The reflectence and transmittance m..
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- Olympian
- n&k
- Automated measuring the n index and k index, and thickne..
- 1. The spectral range of this system is 190-15000nm 2. The reflectence and transmittance ..
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